Art

J-GLOBAL ID：200902281617245451   Reference number：07A1216152

The stability of adiabatic reversible logic using asymmetric tank capacitors and its application to SRAM

非対称タンクキャパシタを用いた断熱可逆論理の安定性及びそのSRAMへの応用

Author (1)： NAKATA Shunji (NTT Microsystem Integration Laboratories)
Material： IEICE Electronics Express (Web)  (IEICE Electron Express (Web))
Volume： 2  Issue： 20  Page： 512-518 (J-STAGE)  Publication year： 2005 
JST Material Number： U0039A  ISSN： 1349-2543  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *SRAM ,...
Semi thesaurus term： capacitor

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JST classification (1)： Semiconductor integrated circuit  (NC03162T)

Reference (9)：

• [1] S. Nakata, “Observation of Coulomb-blockade oscillations by the back gate with subattofarad mutual capacitance, ” Phys. Rev. B, vol. 47, pp. 1679-1682, 1993.
• [2] Y. Takahashi, H. Namatsu, K. Kurihara, K. Iwadate, M. Nagase, and K. Murase, “Size dependence of the characteristics of Si single-electron transistors on SIMOX substrates, ” IEEE Trans. Electron Devices, ED-43, pp. 1213-1217, 1996.
• [3] M. Akazawa, “Adiabatic switching by quasistatic operation of single-electron-tunneling devices, ” IEICE Trans. Electron., vol. J86-C, no. 7, pp. 718-725, 2003 [in Japanese].
• [4] T. Oya, A. Schmid, T. Asai, Y. Leblebici, and Y. Amemiya, “On the fault tolerance of a clustered single-electron neural network for differential enhancement, ” IEICE Electron. Express, vol. 2, no. 3, pp. 76-80, 2005.
• [5] E. Morifuji, T. Yoshida, H. Tsuno, Y. Kikuchi, S. Matsuda, S. Yamada, T. Noguchi, and M. Kakumu, “New guideline of Vdd and Vth scaling for 65nm technology and beyond, ” Proc. Symp. VLSI Tech. Dig., pp. 164-165, 2004.

Terms in the title (7)： 非対称 ,  タンク ,  キャパシタ ,  断熱可逆論理 ,  安定性 ,  SRAM ,  応用