Electronic structure of CeRu<sub>2</sub>X<sub>2</sub> (X=Si,Ge) in the paramagnetic phase studied by soft x-ray ARPES and hard x-ray photoelectron spectroscopy

YANO M.; SEKIYAMA A.; FUJIWARA H.; AMANO Y.; IMADA S.; MURO T.; YABASHI M.; YABASHI M.; TAMASAKU K.; HIGASHIYA A.; ISHIKAWA T.; ONUKI Y.; SUGA S.

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J-GLOBAL ID：200902286340168588 Reference number：08A0218343

Electronic structure of CeRu₂X₂ (X=Si,Ge) in the paramagnetic phase studied by soft x-ray ARPES and hard x-ray photoelectron spectroscopy

常磁性相のCeRu₂X₂(X=Si,Ge)の電子構造の軟X線ARPESおよび硬X線光電子分光による研究

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Volume： 77 Issue： 3 Page： 035118.1-035118.8 Publication year： Jan. 2008
JST Material Number： D0746A ISSN： 1098-0121 CODEN： PRBMDO Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Electron spectroscopy , X-ray spectra in general.Including X-ray

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Electronic structure of CeRu2X2 (X=Si,Ge) in the paramagnetic phase studied by soft x-ray ARPES and hard x-ray photoelectron spectroscopy

Electronic structure of CeRu₂X₂ (X=Si,Ge) in the paramagnetic phase studied by soft x-ray ARPES and hard x-ray photoelectron spectroscopy