Art
J-GLOBAL ID：200902286707004439
Reference number：05A0306873
Evidence of Correlation between Dark Spots and Dislocations Originating from Substrate in Light-Emitting Diodes
発光ダイオードの基板に起因する暗スポットと転位間の相関の証拠
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Author (5)：
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Material：
Volume：
44
Issue：
2
Page：
1004-1008
Publication year：
Feb. 15, 2005
JST Material Number：
G0520B
ISSN：
0021-4922
Document type：
Article
Article type：
原著論文
Country of issue：
Japan (JPN)
Language：
ENGLISH (EN)
Thesaurus term：
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Keywords indexed to the article.
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JST classification (1)：
JST classification
Category name(code) classified by JST.
Light emitting devices
Reference (7)：
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1) M. Ettenberg: J. Appl. Phys. 45 (1974) 901.
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2) G. R. Booker, J. M. Titchmarsh, J. Fletcher, D. B. Darby, M. Hockly and M. Al-Jassim: J. Cryst. Growth 45 (1978) 407.
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3) M. Fukuda: Reliability and Degradation of Semiconductor Lasers and LEDs (Artech House, Boston, 1991).
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4) O. Ueda: Reliability and Degradation of III–V Optical Devices (Artech House, Boston, 1996).
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5) T. Kato, H. Susawa, M. Hirotani, T. Saka, Y. Ohashi, E. Shichi and S. Shibata: J. Cryst. Growth 107 (1991) 832.
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Terms in the title
Keywords automatically extracted from the title.
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