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J-GLOBAL ID:200902295524374813   Reference number:04A0692333

熱処理によるZnO薄膜中の結晶欠陥の変化

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Volume: 65th  Issue:Page: 547  Publication year: Sep. 01, 2004 
JST Material Number: Y0055A  Document type: Proceedings
Article type: 短報  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Oxide thin films  ,  Lattice defects in semiconductors 
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