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J-GLOBAL ID:200902296705212587
Reference number:06A0475286
Nanoscale phase changes in crystalline Ge2Sb2Te5 films using scanning probe microscopes
走査プローブ顕微鏡を用いた結晶Ge2Sb2Te5膜におけるナノスケール相変化
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Author (3):
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,
Material:
Volume:
99
Issue:
2
Page:
024306-024306-7
Publication year:
Jan. 15, 2006
JST Material Number:
C0266A
ISSN:
0021-8979
CODEN:
JAPIAU
Document type:
Article
Article type:
原著論文
Country of issue:
United States (USA)
Language:
ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
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JST classification (2):
JST classification
Category name(code) classified by JST.
Semiconductor thin films
, Solid phase transitions
Terms in the title (4):
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Keywords automatically extracted from the title.
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