Art
J-GLOBAL ID:200902297624997373
Reference number:04A0357214
Study of thermal oxidation of LaSix/Si(100) by grazing incidence electron-induced X-ray emission spectroscopy
すれすれ入射電子誘起X線放射分光によるLaSix/Si(100)の熱酸化の研究
-
Publisher site
Copy service
{{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=04A0357214©=1") }}
-
Access JDreamⅢ for advanced search and analysis.
{{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=04A0357214&from=J-GLOBAL&jstjournalNo=D0266C") }}
Author (2):
,
Material:
Volume:
135
Issue:
1
Page:
47-52
Publication year:
Mar. 2004
JST Material Number:
D0266C
ISSN:
0368-2048
Document type:
Article
Article type:
原著論文
Country of issue:
Netherlands (NLD)
Language:
ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
JST classification (2):
JST classification
Category name(code) classified by JST.
X-ray spectra in general.Including X-ray
, Oxide thin films
Terms in the title (8):
Terms in the title
Keywords automatically extracted from the title.
,
,
,
,
,
,
,
Return to Previous Page