Art
J-GLOBAL ID:200902297624997373   Reference number:04A0357214

Study of thermal oxidation of LaSix/Si(100) by grazing incidence electron-induced X-ray emission spectroscopy

すれすれ入射電子誘起X線放射分光によるLaSix/Si(100)の熱酸化の研究
Author (2):
Material:
Volume: 135  Issue:Page: 47-52  Publication year: Mar. 2004 
JST Material Number: D0266C  ISSN: 0368-2048  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
Thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
,...
   To see more with JDream III (charged).   {{ this.onShowAbsJLink("http://jdream3.com/lp/jglobal/index.html?docNo=04A0357214&from=J-GLOBAL&jstjournalNo=D0266C") }}
JST classification (2):
JST classification
Category name(code) classified by JST.
X-ray spectra in general.Including X-ray  ,  Oxide thin films 

Return to Previous Page