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J-GLOBAL ID:200902298836444133   Reference number:03A0227108

Measurement of Biaxial Stress Using Grown Grain Density Rate in Electrodeposited Copper Foil with a Microcircular Hole.

微小円孔を有する電着銅薄膜の成長粒子発生密度を利用した二軸応力検出法
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Material:
Volume: 69  Issue: 679  Page: 565-570  Publication year: Mar. 25, 2003 
JST Material Number: F0227B  ISSN: 0387-5008  Document type: Article
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Metallic materials  ,  Electroforming 

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