Rchr
J-GLOBAL ID:201001083637797737
Update date: Nov. 09, 2024
Shimizu Yasuo
シミズ ヤスオ | Shimizu Yasuo
Affiliation and department:
Homepage URL (1):
https://scholar.google.com/citations?user=fypcITMAAAAJ&hl=ja
Research field (5):
Nanobioscience
, Nanomaterials
, Biomaterials
, Biomedical engineering
, Electric/electronic material engineering
Research keywords (10):
自己拡散
, Focused ion beam
, Solar cells
, Steel materials
, Hydrogen
, Isotopes
, biomaterials
, Defects
, Positron annihilation
, Atom probe tomography
Research theme for competitive and other funds (16):
- 2020 - 2023 サブナノ分解能応力下その場観察法の開拓による新たな照射硬化機構の解明
- 2018 - 2023 Development of single dopant circuit by deterministic doping and application to stochastic processing
- 2018 - 2022 革新炉材料開発のための次世代ナノスケール解析法の開発と照射後実験研究の国際ハブの構築
- 2020 - 2021 Three-dimensional atomic-scale control of co-doped elemental distributions towards highefficiency luminescent devices
- 2018 - 2019 フレキシブル・超軽量SHJ太陽電池およびタンデム化の要素技術の開発
- 2016 - 2019 Study of Radiation Damage Mechanisms of Structural Materials in Nuclear Reactors by Defect structure - Elemental distribution Tomography
- 2015 - 2018 Establishment of analysis of single nanowire by atom probe tomography in combination with transmission electron microscopy
- 2014 - 2017 Dopant diffusion paths in polycrystalline silicon gate of three-dimensional metal-oxide-semiconductor field effect transistor investigated by atom probe tomography
- 2014 - 2016 Three-dimensional nanoscale elemental analysis in human teeth by atom probe tomography towards their soundness evaluation
- 2012 - 2016 原子炉容器構造材料の微視的損傷機構の解明を通じた脆化予測モデルに関する研究開発
- 2012 - 2015 Atomic scale observation of grain boundary segregation in nuclear materials by atom probe tomography and study on mechanism of grain boundary degradation
- 2012 - 2014 Interaction of coimplanted heterogeneous dopants in semiconductor materials investigated using three-dimensional atom probe
- 2011 - 2012 アトムプローブを用いた異種原子クラスターの観察および極浅活性層形成の制御
- 2011 - 2012 アトムプローブによる半導体電子デバイス構造中の広範領域ドーパント分布評価法の確立
- 2009 - 2012 Atomic scale observation of grain boundary segregation in nuclear materials by atom probe tomography and study on mechanism of grain boundary degradation
- 2008 - 2010 同位体を用いたナノCMOSにおけるシリコン-不純物相互作用の研究
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Papers (115):
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Shota Ishimi, Makoto Hirose, Yasuo Shimizu, Yutaka Ohno, Yasuyoshi Nagai, Jianbo Liang, Naoteru Shigekawa. Fabrication and Electrical Characterization of GaAs/GaN Junctions. ECS Transactions. 2023. 112. 3. 111-118
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Kazuki Sawai, Jianbo Liang, Yasuo Shimizu, Yutaka Ohno, Yasuyoshi Nagai, Naoteru Shigekawa. Characterization of Ga-face/Ga-face and N-face/N-face interfaces with antiparallel polarizations fabricated by surface-activated bonding of freestanding GaN wafers. Japanese Journal of Applied Physics. 2023. 62. SN. SN1013-SN1013
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Ayaka Kobayashi, Hazuki Tomiyama, Yutaka Ohno, Yasuo Shimizu, Yasuyoshi Nagai, Naoteru Shigekawa, Jianbo Liang. Room-temperature bonding of GaN and diamond via a SiC layer. Functional Diamond. 2022. 2. 1. 142-150
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Yutaka Ohno, Jianbo Liang, Hideto Yoshida, Yasuo Shimizu, Yasuyoshi Nagai, Naoteru Shigekawa. Variation in atomistic structure due to annealing at diamond/silicon heterointerfaces fabricated by surface activated bonding. Japanese Journal of Applied Physics. 2022. 61. SF. SF1006/1-SF1006/5
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Jianbo Liang, Daiki Takatsuki, Masataka Higashiwaki, Yasuo Shimizu, Yutaka Ohno, Yasuyoshi Nagai, Naoteru Shigekawa. Fabrication of β-Ga2O3/Si heterointerface and characterization of interfacial structures for high-power device applications. Japanese Journal of Applied Physics. 2022. 61. SF. SF1001/1-SF1001/7
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MISC (19):
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清水康雄. 高性能Si太陽電池の3次元アトムプローブ解析. 応用物理. 2021. 90. 10. 610-616
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Noritaka Usami. (Invited) Application of Machine Learning for High-Performance Multicrystalline Materials. ECS Transactions. 2021. 102. 4. 11-16
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金泰雄, 百瀬健, 出浦桃子, YUAN Tu, 清水康雄, 外山健, 井上耕治, 永井康介, 霜垣幸浩. アトムプローブによるCVD薄膜中の合金原子組成分析. 東北大学金属材料研究所附属量子エネルギー材料科学国際研究センター共同利用研究経過報告書(CD-ROM). 2017. 34
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金泰雄, YUAN Tu, 嶋紘平, 韓斌, 清水康雄, 百瀬健, 外山健, 井上耕治, 永井康介, 霜垣幸浩. アトムプローブによるCVD薄膜中の合金原子組成分析. 東北大学金属材料研究所附属量子エネルギー材料科学国際研究センター共同利用研究経過報告書(CD-ROM). 2016. 33
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嶋紘平, TU Yuan, HAN Bin, 高見澤悠, 清水秀治, 清水康雄, 百瀬健, 井上耕治, 永井康介, 霜垣幸浩. Sub-nanoscale Structure and Barrier Performance of CVD-Cu(Mn)/ALD-Co(W) Interconnect System Proved Using 3D Atom Probe. 電子情報通信学会技術研究報告. 2015. 114. 469(SDM2014 162-169). 39-44
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Patents (2):
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半導体装置およびその製造方法
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イオン照射効果評価方法,プロセスシミュレータ及びデバイスシミュレータ
Books (1):
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試料分析講座 半導体・電子材料分析(日本分析化学会編)
丸善出版 2013 ISBN:9784621087008
Lectures and oral presentations (307):
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Hydrogen detection in high-performance Si solar cells by atom probe tomography
(14th International Symposium on Atomic Level Characterizations for New Materials and Devices’22 (ALC’22) 2022)
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Fabrication of high-thermal-stability GaN/diamond junctions via intermediate layers
(Conference on Wafer Bonding for Microsystems, 3D- and Wafer Level Integration (WaferBond'22) 2022)
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3次元アトムプローブによるフェライト鋼中のナノ析出物における水素トラップの可視化と水素トラップ能に及ぼす析出物サイズの影響
(日本金属学会2022年秋期(第171回)講演大会 2022)
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表面活性化接合法によるGaN/GaN接合界面の評価
(第83回応用物理学会秋季学術講演会 2022)
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Electrical properties in wafer-bonding-based GaAs/GaN junctions on free-standing substrates
(14th Topical Workshop on Heterostructure Microelectronics (TWHM2022) 2022)
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Education (2):
- 2004 - 2009 Keio University 大学院理工学研究科 School of Fundamental Science and Technology
- 2000 - 2004 Keio University Faculty of Science and Technology Department of Applied Physics and Physico-Informatics
Professional career (1):
- Ph.D. in Engineering (Keio University)
Work history (7):
- 2021/12 - 現在 Sony Semiconductor Solutions Corporation
- 2020/05 - 2021/11 National Institute for Materials Science
- 2020/04 - 2020/04 Tohoku University Institute for Materials Research Academic Researcher
- 2010/04 - 2020/03 Tohoku University Institute for Materials Research, Irradiation Effects in Nuclear and Their Related Materials Assistant Professor
- 2008/04 - 2010/03 Japan Society for the Promotion of Science
- 2009/04 - 2010/01 IMEC vzw (Belgium) Visiting Post-doctoral Researcher
- 2009/04 - 2010/01 Katholieke Universiteit Leuven (Belgium) Visiting Post-doctoral Researcher
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Committee career (6):
Awards (10):
- 2024/03 - 応用物理学会 第45回応用物理学会優秀論文賞 Insight into segregation sites for oxygen impurities at grain boundaries in silicon
- 2021/10 - 7th International Workshop on Low Temperature Bonding for 3D Integration Best Short Presentation Award Fabrication of GaN/SiC/diamond structure for efficient thermal management of power device
- 2021/10 - 7th International Workshop on Low Temperature Bonding for 3D Integration Best Presentation Award Fabrication of Ga<SUB>2</SUB>O<SUB>3</SUB>/Si direct bonding interface for high power device applications
- 2017/04/01 - Japan Society of Applied Physics JSAP Poster Award Atom probe tomographic study on implanted deuterium in Al<SUB>2</SUB>O<SUB>3</SUB>/Hf<SUB>x</SUB>Si<SUB>1-x</SUB>O<SUB>2</SUB>/SiO<SUB>2</SUB> Stacks
- 2016/06 - International Field Emission Society APT&M2016 Best Poster Award Atom probe tomographic study of human tooth materials
- 2013/05/22 - 東北大学金属材料研究所 東北大学金属材料研究所所内講演会優秀ポスター賞 アトムプローブ法によるゲルマニウム同位体超構造の3次元分布解析
- 2012/11 - Materials Research Society MRS Outstanding Poster Award Atom probe tomography of germanium isotopic multilayer structures
- 2011/03/29 - 半導体MIRAIプロジェクト MIRAI賞最優秀賞 大規模TEGを用いたばらつきメカニズム解明と低減化手法の開発
- 2007/11 - SIMS-XVI (第16回二次イオン質量分析に関する国際会議) SIMS-XVI Student Award Silicon isotope superlattices: Ideal SIMS standards for shallow junction characterization
- 2006/08 - (社)応用物理学会 第20回応用物理学会講演奨励賞 シリコン同位体超格子を用いた砒素注入時のミキシングのSIMSによる評価
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Association Membership(s) (1):
Japan Society of Applied Physics
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