Probabilistic analysis of random test generation method for irredundant combinational logic networks.

AGRAWAL P; AGRAWAL V D

Art

J-GLOBAL ID：201002055535726576 Reference number：75A0291473

Probabilistic analysis of random test generation method for irredundant combinational logic networks.

冗長でない組合せ論理回路網に対するランダム検査発生法の確率論的解析

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Material：
Volume： 24 Issue： 7 Page： 691-695 Publication year： 1975
JST Material Number： C0233A Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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