Art
J-GLOBAL ID：201002060663747601   Reference number：80A0254404

Subsurface flaw detection in metals by photoacoustic microscopy.

光音響顕微鏡法による金属中の表面下欠陥検出
Author (6)：
THOMAS R L

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(Wayne State Univ., Michigan)

About Wayne State Univ., Michigan

, 
POUCH J J

About POUCH J J

(Wayne State Univ., Michigan)

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, 
WONG Y H

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(Wayne State Univ., Michigan)

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, 
FAVRO L D

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(Wayne State Univ., Michigan)

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, 
KUO P K

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(Wayne State Univ., Michigan)

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, 
ROSENCWAIG A

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(Univ. California)

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Material：
J Appl Phys  (Journal of Applied Physics)

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Volume： 51  Issue： 2  Page： 1152-1156  Publication year： 1980 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIA  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
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光音響効果

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光音響顕微鏡

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欠陥検出

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