Art

J-GLOBAL ID：201002207623554208   Reference number：10A0732457

Analysis of Errors in Permittivity Measurements Using the Waveguide-Penetration Method

導波管挿入法を用いた誘電率測定における誤差の解析

Author (2)： KIK Alfred (Tokyo Inst. Technol., Tokyo, JPN) ,  NISHIKATA Atsuhiro (Tokyo Inst. Technol., Tokyo, JPN)
Material： IEICE Transactions on Communications (Institute of Electronics, Information and Communication Engineers)  (IEICE Trans Commun (Inst Electron Inf Commun Eng))
Volume： E93-B  Issue： 7  Page： 1697-1706  Publication year： Jul. 01, 2010 
JST Material Number： L1369A  ISSN： 0916-8516  Document type： Article
Article type： 原著論文  Country of issue： Japan (JPN)  Language： ENGLISH (EN)

Thesaurus term： *rectangular waveguide ,  permittivity ,  *error analysis ,  electrical measurement ,  S-matrix ,  *S parameter ,  *dielectric measurement ,  *Mathematics ,  *analysis ,  *theory of errors
Semi thesaurus term： rectangular waveguide ,  cylindrical bar ,  *dielectric measurement

JST classification (1)： Measuring techniques and equipments of dielectric properties  (BM05020Q)

Reference (8)：

• NICOLSON, A. M. Measurement of the intrinsic properties of materials by time-domain techniques. IEEE Trans. Instrum. Meas. 1970, IM-19, 11, 377-382
• WEIR, W. B. Automatic measurement of complex dielectric constant and permeability at microwave frequencies. Proc. IEEE. 1974, 62, 1, 33-36
• NISHIKATA, A. A swept-frequency measurement of complex permittivity and complex permeability of a columnar specimen inserted in a rectangular waveguide. IEEE Trans. Microw. Theory Tech. 2007, 55, 7, 1554-1567
• NISHIKATA, A. Scattering analysis for layered cylindrical object perpendicularly piercing the wider walls of a rectangular waveguide and its application to ε_r and μ_r measurement. IEEE Trans. Microw. Theory Tech. 2009, 57, 6, 1602-1611
• ENGEN, G. F. Thru-reflect-line : An improved technique for calibrating the dual six-port automatic network analyzer. IEEE Trans. Microw. Theory Tech. 1979, MTT-27, 12, 987-993

Terms in the title (4)： 導波管 ,  誘電率測定 ,  誤差 ,  解析