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J-GLOBAL ID:201102261117157995   Reference number:11A1804470

Elemental mapping using full-field X-ray fluorescence imaging microscope.

結像型蛍光X線顕微鏡による元素マッピング
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Volume: 80  Issue: 11  Page: 983-986  Publication year: Nov. 10, 2011 
JST Material Number: F0252A  ISSN: 0369-8009  CODEN: OYBSA  Document type: Article
Article type: 解説  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Microscopy determination of structures  ,  Other phsical analysis 
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