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J-GLOBAL ID:201102294247980648   Reference number:11A0926765

Fabrication of Ge Metal-Oxide-Semiconductor Capacitors with High-Quality Interface by Ultrathin SiO2/GeO2 Bilayer Passivation and Postmetallization Annealing Effect of Al

極薄SiO2/GeO2二層膜不動態化とAlのメタライゼーション後焼なまし効果による高品質界面を持つGe金属酸化物半導体コンデンサの作製
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Volume: 50  Issue: 4,Issue 2  Page: 04DA10.1-04DA10.5  Publication year: Apr. 25, 2011 
JST Material Number: G0520B  ISSN: 0021-4922  CODEN: JJAPB6  Document type: Article
Article type: 原著論文  Country of issue: United Kingdom (GBR)  Language: ENGLISH (EN)
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