Research keywords (10):
Intelligent Nano Metrology
, Computational Imaging
, Geometric Modeling
, Super-resolution
, Phase Shifting Interferometry
, Digital Optical Phase Conjugation
, Light-field Microscopy
, White light interferometry
, Sparse Deconvolution
, Structured Illumination Microscopy
SPIE
, The Japan Society of Mechanical Engineers
, The Japan Society for Precision Engineering