Art
J-GLOBAL ID:201202254339758580   Reference number:12A0160894

In-situ lattice-strain analysis of a ferroelectric thin film under an applied pulse electric field

印加パルス電場下の強誘電性薄膜のその場格子歪分析
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Material:
Volume: 1234  Page: 151-154  Publication year: 2010 
JST Material Number: D0071C  ISSN: 0094-243X  Document type: Proceedings
Country of issue: United States (USA)  Language: ENGLISH (EN)
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