Art
J-GLOBAL ID:201302247378233356   Reference number:13A1839027

Time-of-flight secondary ion mass spectrometry with energetic cluster ion impact ionization for highly sensitive chemical structure characterization

高感度化学構造特性評価のための高エネルギークラスタイオン衝突イオン化を用いる飛行時間二次イオン質量分析法
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Material:
Volume: 314  Page: 39-42  Publication year: 2013 
JST Material Number: H0899A  ISSN: 0168-583X  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
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Mass spectrometry 

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