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J-GLOBAL ID:201302249253693870   Reference number:13A1654955

Investigation of deep-level defects in Cu(In,Ga)Se2 thin films by two-wavelength excitation photo-capacitance spectroscopy

二波長励起光静電容量分光法によるCu(In,Ga)Se2薄膜の深準位欠陥の研究
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Volume: 103  Issue: 16  Page: 163905-163905-4  Publication year: Oct. 14, 2013 
JST Material Number: H0613A  ISSN: 0003-6951  CODEN: APPLAB  Document type: Article
Article type: 短報  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Lattice defects in semiconductors 

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