Art
J-GLOBAL ID:201302253911213150   Reference number:12A1798797

Identification of defect types in moderately Si-doped GaInNAsSb layer in p-GaAs/n- GaInNAsSb/n-GaAs solar cell structure using admittance spectroscopy

アドミッタンス分光法を用いた,p-GaAs/n-GaInNAsSb/n-GaAs太陽電池構造内の適度にSiドープしたGaInNAsSb層における欠陥型の同定
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Material:
Volume: 112  Issue: 11  Page: 114910-114910-9  Publication year: Dec. 01, 2012 
JST Material Number: C0266A  ISSN: 0021-8979  CODEN: JAPIAU  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Solar cell  ,  Lattice defects in semiconductors  ,  Electric conduction in crystalline semiconductors 

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