Art
J-GLOBAL ID:201302283797523140   Reference number:13A0083368

Local potential profiling of operating carbon nanotube transistor using frequency-modulation high-frequency electrostatic force microscopy

周波数変調高周波静電力顕微鏡を使った作動しているカーボンナノチューブトランジスタの局所電位プロファイリング
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Material:
Volume: 102  Issue:Page: 013115-013115-5  Publication year: Jan. 07, 2013 
JST Material Number: H0613A  ISSN: 0003-6951  CODEN: APPLAB  Document type: Article
Article type: 短報  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Transistors  ,  Microscopy determination of structures 
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