TEM Observation and Ionic Conductivity Study of Li<sub>2</sub>SiO<sub>3</sub> Thin-Film on Sapphire Substrate

FURUSAWA Shin-ichi; TSURUI Takao; SHIMIZU Kouhei

Art

J-GLOBAL ID：201402251967859928 Reference number：14A0289381

TEM Observation and Ionic Conductivity Study of Li₂SiO₃ Thin-Film on Sapphire Substrate

サファイア基板上のLi₂SiO₃薄膜のTEM観測およびイオン伝導

Publisher site Copy service {{ this.onShowCLink("http://jdream3.com/copy/?sid=JGLOBAL&noSystem=1&documentNoArray=14A0289381&COPY=1") }}
Access JDreamⅢ for advanced search and analysis. {{ this.onShowJLink("http://jdream3.com/lp/jglobal/index.html?docNo=14A0289381&from=J-GLOBAL&jstjournalNo=D0744C") }}

Author (3)： , ,
Material：
Volume： 596 Page： 15-20 Publication year： 2014
JST Material Number： D0744C ISSN： 1013-9826 Document type： Article
Article type：原著論文 Country of issue： Switzerland (CHE) Language： ENGLISH (EN)

, , , , , , , ,

Secondary batteries

, , , ,

Return to Previous Page

TEM Observation and Ionic Conductivity Study of Li2SiO3 Thin-Film on Sapphire Substrate

TEM Observation and Ionic Conductivity Study of Li₂SiO₃ Thin-Film on Sapphire Substrate