Art

J-GLOBAL ID：201402259907592133   Reference number：14A1122190

Nano-palpation AFM and its quantitative mechanical property mapping

ナノ触診AFMとその定量的な機械特性のマッピング

Author (8)： NAKAJIMA Ken (Tohoku Univ., Sendai, JPN) ,  ITO Makiko (Tohoku Univ., Sendai, JPN) ,  WANG Dong (Tohoku Univ., Sendai, JPN) ,  LIU Hao (Tohoku Univ., Sendai, JPN) ,  NGUYEN Hung Kim (Tohoku Univ., Sendai, JPN) ,  LIANG Xiaobin (Tohoku Univ., Sendai, JPN) ,  KUMAGAI Akemi (Tohoku Univ., Sendai, JPN) ,  FUJINAMI So (Tohoku Univ., Sendai, JPN)
Material： Microscopy
Volume： 63  Issue： 3  Page： 193-207  Publication year： Jun. 2014 
JST Material Number： W1384A  ISSN： 2050-5698  Document type： Article
Article type： 文献レビュー  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： Palpation ,  *atomic force microscope ,  *soft material ,  curve ,  contact ,  *Young's modulus ,  energy ,  Elastic Modulus ,  Mechanics ,  *Hertzian contact ,  contact dynamics ,  *load - displacement curve
Semi thesaurus term： *load - deformation curve ,  *adhesion energy ,  modulus of elasticity

JST classification (2)： Nondestructive testing  (HB02030F) ,  Microscopy determination of structures  (BK01040E)

Reference (62)：

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• Bonnell D (2001) Scanning probe microscopy and spectroscopy (Wiley, New York).

Terms in the title (5)： 触診 ,  AFM ,  定量 ,  機械特性 ,  マッピング