Art

J-GLOBAL ID：201402295749516137   Reference number：14A0706487

Zeta potential measurements for determining polarization of ZnO films

ZnO薄膜の分極の決定に対するζ電位測定

Author (8)： FURUBAYASHI Yutaka (Shimane Univ., Matsue, JPN) ,  HAYASHI Taisuke (Shimane Univ., Matsue, JPN) ,  MORITO Shigekazu (Shimane Univ., Matsue, JPN) ,  HIRAGINO Yuto (Shimane Univ., Matsue, JPN) ,  YEH Wenchang (Shimane Univ., Matsue, JPN) ,  KAJIKAWA Yasutomo (Shimane Univ., Matsue, JPN) ,  HASHIMOTO Hideki (Shimane Univ., Matsue, JPN) ,  FUJITA Yasuhisa (Shimane Univ., Matsue, JPN)
Material： Japanese Journal of Applied Physics  (JJAP)
Volume： 53  Issue： 5S1  Page： 05FE01.1-05FE01.5  Publication year： May. 2014 
JST Material Number： G0520B  ISSN： 0021-4922  CODEN： JJAPB6  Document type： Article
Article type： 原著論文  Country of issue： United Kingdom (GBR)  Language： ENGLISH (EN)

Thesaurus term： *compound semiconductor ,  *zinc oxide ,  *semiconductor thin film ,  dielectric polarization ,  *zeta-potential ,  MOCVD ,  substrate (plate) ,  alumina ,  X-Ray Diffraction ,  crystal structure ,  RHEED ,  convergent-beam electron diffraction ,  crystal orientation ,  wafer ,  counter-ion ,  chemisorption ,  polarity

JST classification (2)： Oxide thin films  (BK14050P) ,  Measuring techniques and equipments of dielectric properties  (BM05020Q)

Reference (26)：

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Terms in the title (3)： ZnO薄膜 ,  分極 ,  電位測定