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J-GLOBAL ID:201402299540046970   Reference number:14A0045526

Pixel length calibration using a pattern matching method for secondary-electron images

パターンマッチング法を用いた二次電子像用のピクセル長キャリブレーション
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Material:
Volume: 8769  Issue: Pt.1  Page: 876909.1-876909.6  Publication year: 2013 
JST Material Number: D0943A  ISSN: 0277-786X  CODEN: PSISDG  Document type: Proceedings
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Semi thesaurus term:
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.

JST classification (2):
JST classification
Category name(code) classified by JST.
Measuring methods and instruments of length,area,cross section,volume,angle  ,  Pattern recognition 
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