About SUGAWARA Kentaro
About National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN
About MISUMI Ichiko
About National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN
About GONDA Satoshi
About National Inst. Advanced Industrial Sci. and Technol. (AIST), Ibaraki, JPN
About Proceedings of SPIE
About grain size analysis
About image
About calibration
About interferometer
About positioning device
About image processing
About pattern matching
About computer code
About character(group theory)
About scanning electron microscope
About nano particle
About laser interferometer
About SEM image
About X-Y stage
About analysis software
About uncertainty budget
About particle sizing
About Measuring methods and instruments of length,area,cross section,volume,angle
About Pattern recognition
About パターンマッチング
About 二次電子
About ピクセル
About キャリブレーション