Art

J-GLOBAL ID：201502219651786704   Reference number：15A0698184

Structural modification of nanocrystalline diamond films via positive/negative bias enhanced nucleation and growth processes for improving their electron field emission properties

電界放出特性を改良するための正/負バイアスを使用した核形成増加と成長プロセスによるナノ結晶ダイヤモンド薄膜の構造改質

Author (7)： SARAVANAN A. (Graduate Inst. of Electro-Optical Engineering and Dep. of Electronic Engineering, National Taiwan Univ. of Sci. and ...) ,  HUANG B. R. (Graduate Inst. of Electro-Optical Engineering and Dep. of Electronic Engineering, National Taiwan Univ. of Sci. and ...) ,  SANKARAN K. J. (Dep. of Materials Sci. and Engineering, National Tsing Hua Univ., Hsinchu 300, Taiwan) ,  KEISER G. (Graduate Inst. of Electro-Optical Engineering and Dep. of Electronic Engineering, National Taiwan Univ. of Sci. and ...) ,  KURIAN J. (Dep. of Physics, Tamkang Univ., Tamsui 251, Taiwan) ,  TAI N. H. (Dep. of Materials Sci. and Engineering, National Tsing Hua Univ., Hsinchu 300, Taiwan) ,  LIN I. N. (Dep. of Physics, Tamkang Univ., Tamsui 251, Taiwan)
Material： Journal of Applied Physics  (Journal of General Physics and its Application to Other Sciences and to Industry)
Volume： 117  Issue： 21  Page： 215307-215307-11  Publication year： Jun. 07, 2015 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIAU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Thesaurus term： *field emission ,  *voltage ,  *bias ,  *nucleation ,  *thin film growth ,  semiconductor thin film ,  improvement ,  crystal grain ,  Graphite ,  grain boundary ,  transmission electron microscope ,  emission spectrometry ,  scanning electron microscope ,  electron energy loss spectroscopy ,  Raman spectrometry ,  current-voltage characteristic ,  *Diamond ,  nano crystal ,  nanographite ,  *nanocrystalline diamond film ,  *ore ,  *precious stone
Semi thesaurus term： structure improvement ,  正電圧 ,  negative voltage

JST classification (2)： Thermoionic emission and field emission  (BM09020S) ,  Semiconductor thin films  (BK14040E)

Terms in the title (8)： 電界放出 ,  バイアス ,  核形成 ,  成長 ,  プロセス ,  ナノ結晶 ,  ダイヤモンド薄膜 ,  改質