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J-GLOBAL ID：201602255713642801   Reference number：16A1273672

Investigation of pitting corrosion of diamond-like carbon films using synchrotron-based spectromicroscopy

シンクロトロンベース分光顕微鏡法を用いたダイヤモンド状炭素膜の孔食の研究

Author (10)： Tunmee Sarayut (Graduate School of Engineering, Nagaoka University of Technology, Nagaoka 940-2188, Japan) ,  Photongkam Pat (Synchrotron Light Research Institute, 111 University Avenue, Nakhon Ratchasima 30000, Thailand) ,  Euaruksakul Chanan (Synchrotron Light Research Institute, 111 University Avenue, Nakhon Ratchasima 30000, Thailand) ,  Takamatsu Hiroki (Laboratory of Advanced Science and Technology for Industry, 3-1-2 Koto, 678-1205 Hyogo, Japan) ,  Zhou XiaoLong (Graduate School of Engineering, Nagaoka University of Technology, Nagaoka 940-2188, Japan) ,  Wongpanya Pornwasa (School of Metallurgical Engineering, Suranaree University of Technology, Nakhon Ratchasima 30000, Thailand) ,  Komatsu Keiji (Graduate School of Engineering, Nagaoka University of Technology, Nagaoka 940-2188, Japan) ,  Kanda Kazuhiro (Laboratory of Advanced Science and Technology for Industry, 3-1-2 Koto, 678-1205 Hyogo, Japan) ,  Ito Haruhiko (Graduate School of Engineering, Nagaoka University of Technology, Nagaoka 940-2188, Japan) ,  Saitoh Hidetoshi (Graduate School of Engineering, Nagaoka University of Technology, Nagaoka 940-2188, Japan)
Material： Journal of Applied Physics  (Journal of General Physics and its Application to Other Sciences and to Industry)
Volume： 120  Issue： 19  Page： 195303-195303-10  Publication year： Nov. 21, 2016 
JST Material Number： C0266A  ISSN： 0021-8979  CODEN： JAPIAU  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： Corrosion behavior of diamond-...

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Thesaurus term： *diamond-like carbon ,  *carbon ,  *thin film ,  *pitting corrosion ,  *microspectroscopy ,  *synchrotron ,  electrochemical polarization ,  pitting corrosion resistance ,  chemical bond ,  electron microscopy ,  Raman spectrum ,  XANES ,  scanning electron microscope
Semi thesaurus term： NEXAFS ,  photoemission electron microscopy ,  pi-bond ,  *microscopic spectroscopy ,  pitting resistance ,  potentiodynamic polarization

JST classification (2)： Semiconductor thin films  (BK14040E) ,  Carbon and its compounds  (YB02060D)

Terms in the title (6)： シンクロトロン ,  分光 ,  顕微鏡法 ,  ダイヤモンド状炭素 ,  孔食 ,  研究