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J-GLOBAL ID：201702218736402682   Reference number：17A0964023

Preparation and Characterization of Sn-BSTS Topological Insulator for Universality Test of the Quantum Hall Effect

量子H all効果の普遍性試験のためのSn BSTSトポロジカル絶縁体の調製と特性化【Powered by NICT】

Author (7)： Misawa Tetsuro (National Metrology Institute of Japan, AIST, Tsukuba, Japan) ,  Fukuyama Yasuhiro (National Metrology Institute of Japan, AIST, Tsukuba, Japan) ,  Okazaki Yuma (National Metrology Institute of Japan, AIST, Tsukuba, Japan) ,  Nakamura Shuji (National Metrology Institute of Japan, AIST, Tsukuba, Japan) ,  Nasaka Nariaki (Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama, Japan) ,  Sasagawa Takao (Materials and Structures Laboratory, Tokyo Institute of Technology, Yokohama, Japan) ,  Kaneko Nobu-Hisa (National Metrology Institute of Japan, AIST, Tsukuba, Japan)
Material： IEEE Transactions on Instrumentation and Measurement  (IEEE Trans Instrum Meas)
Volume： 66  Issue： 6  Page： 1489-1495  Publication year： 2017 
JST Material Number： C0232A  ISSN： 0018-9456  CODEN： IEIMAO  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： Single crystals of Sn<sub>0.02...

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Thesaurus term： flake ,  single crystal ,  *universality ,  lithography ,  low temperature ,  measuring instrument ,  *characterization ,  temperature dependence ,  *topological insulator ,  charge carrier ,  surface conductance ,  metal surface
Semi thesaurus term： 輸送特性 , 【Automatic Indexing@JST】

JST classification (2)： Measuring methods and instruments of R,L,C,Q, and dielectric constant  (AD07030N) ,  Magnetoelectric devices  (NC03100X)

Terms in the title (8)： 量子 ,  ALL ,  普遍性 ,  試験 ,  Sn ,  トポロジカル絶縁体 ,  調製 ,  特性化