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J-GLOBAL ID：201702223269463423   Reference number：17A0914737

Shielding current analysis in multiple-layered superconducting film with cracks: Application to contactless method for measuring j_C

亀裂のある多層超伝導薄膜における遮蔽電流解析:j_Cを測定するための非接触法への応用【Powered by NICT】

Author (3)： Takayama Teruou (Department of Informatics, Yamagata University, Yonezawa, Yamagata 992-8510) ,  Saitoh Ayumu (Graduate School of Science and Engineering, Yamagata University, Yonezawa, Yamagata 992-8510) ,  Kamitani Atsushi (Graduate School of Science and Engineering, Yamagata University, Yonezawa, Yamagata 992-8510)
Material： IEEE Conference Proceedings  (IEEE Conf Proc)
Volume： 2017  Issue： ICCEM  Page： 198-200  Publication year： 2017 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： Applicability of the scanning ...

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Thesaurus term： scanning ,  *crack ,  permanent magnet ,  *multilayer ,  *thin film ,  adaptability ,  *superconducting thin film ,  critical current density
Semi thesaurus term： *非接触 ,  *遮蔽電流 , 【Automatic Indexing@JST】

JST classification (2)： Superconducting materials  (BM04041W) ,  Properties of superconductors in general  (BM04021A)

Terms in the title (7)： 亀裂 ,  多層 ,  超伝導薄膜 ,  遮蔽電流 ,  解析 ,  非接触 ,  応用