Art

J-GLOBAL ID：201702236675056555   Reference number：17A1149351

Yield Evaluation of 90k Junction-scale Adiabatic Quantum-Flux-Parametron Circuits

断熱型磁束量子パラメトロンを用いた9万接合回路の歩留まり評価

Author (4)： CHINA FUMIHIRO (横浜国大) ,  TAKEUCHI NAOKI (横浜国大) ,  YAMANASHI YUKI (横浜国大) ,  YOSHIKAWA NOBUYUKI (横浜国大)
Material： 電子情報通信学会技術研究報告  (IEICE Technical Report (Institute of Electronics, Information and Communication Engineers))
Volume： 117  Issue： 171(SCE2017 11-20)  Page： 13-18  Publication year： Aug. 02, 2017 
JST Material Number： S0532B  ISSN： 0913-5685  Document type： Proceedings
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)

Thesaurus term： *thermal insulation ,  *flux quantum ,  *resonance circuit ,  *yield(ratio) ,  *integrated circuit ,  *superconductivity ,  consumed electric power ,  Josephson junction ,  AND circuit ,  OR circuit ,  data reading ,  direct current ,  SQUID ,  buffer circuit ,  equivalent circuit ,  gate circuit ,  logic element
Semi thesaurus term： *parametron ,  superconducting integrated circuits ,  AQFP ,  low power ,  logic gate

JST classification (3)： Josephson junction and elements  (BM04043E) ,  Logic circuits  (NC05070B) ,  Semiconductor integrated circuit  (NC03162T)

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Terms in the title (5)： 断熱 ,  磁束量子 ,  パラメトロン ,  歩留まり ,  評価