About KAWAMURA HIROAKI
About MAEDA KANTA
About HASUNUMA RYU
About YAMABE KIKUO
About 応用物理学会春季学術講演会講演予稿集(CD-ROM)
About semiconductor device
About gate dielectric film
About thermal oxidation
About postheating
About load test
About leakage current
About dielectric breakdown
About life test
About trade off
About SiC
About gate oxide
About stress testing
About leakage current
About time dependent dielectric breakdown
About life test
About Metal-insulator-semiconductor structures
About Manufacturing technology of solid-state devices
About Tetraethoxysilane
About TEOS
About CVD
About SiO2
About 絶縁特性
About 基板効果