Art

J-GLOBAL ID：201702239239553670   Reference number：17A1000653

A note on a detection method of cascading failure-occurrences in n-component parallel systems by using likelihood-ratio test

n素子並列システムにおけるカスケード故障の尤度比検定を用いた発生検知に関する一考察

Author (2)： OTA SHUHEI (法政大 大学院理工学研究科) ,  KIMURA MITSUHIRO (法政大 理工)
Material： 電子情報通信学会技術研究報告  (IEICE Technical Report (Institute of Electronics, Information and Communication Engineers))
Volume： 117  Issue： 161(R2017 14-23)  Page： 1-6  Publication year： Jul. 21, 2017 
JST Material Number： S0532B  ISSN： 0913-5685  Document type： Proceedings
Article type： 原著論文  Country of issue： Japan (JPN)  Language： JAPANESE (JA)

Thesaurus term： *semiconductor chip ,  *system ,  *failure ,  *likelihood ratio test ,  *fault detection ,  evaluation ,  life distribution ,  parameter estimation ,  statistical significance ,  *Cascade type failure
Semi thesaurus term： *parallel system ,  *Cascade failure ,  quantitative evaluation

JST classification (1)： Reliability  (KB04040H)

Reference (18)：

• M. Zelen, ed, Statistical theory of reliability, Madison: Uni-versity of Wisconsin Press; 1964.
• X. Yu and A. M. Khambadkone, Reliability analysis and cost optimization of parallel-inverter system, IEEE Trans-actions on Industrial Electronics, 2012;59(10):3881-3889.
• E. Chiodo and D. Lauria, Some basic properties of the fail-ure rate of redundant reliability systems in industrial elec-tronics applications, IEEE Transactions on Industrial Elec-tronics, 2015;62(8):5055-62.
• W. Q. Meeker and L. A. Escobar, Statistical methods for reliability data, Toronto: John Wiley and Sons; 1998.
• M. L. Shooman, Reliability of computer systems and net-works: fault tolerance, analysis, and design, Toronto: John Wiley and Sons; 2002.

Terms in the title (3)： 並列システム ,  カスケード故障 ,  尤度比検定