Art
J-GLOBAL ID：201702243227297170   Reference number：17A0550620

β-Ga2O3単結晶基板の電気的評価

Author (1)：
NAKANO YOSHITAKA

About NAKANO YOSHITAKA

(中部大 工)

About 中部大 工


Material：
応用物理学会春季学術講演会講演予稿集(CD-ROM)  (Extended Abstracts. JSAP Spring Meeting (CD-ROM))

About 応用物理学会春季学術講演会講演予稿集(CD-ROM)


Volume： 64th  Page： ROMBUNNO.16p-P8-16  Publication year： Mar. 01, 2017 
JST Material Number： Y0054B  ISSN： 2436-7613  Document type： Proceedings
Article type： 短報  Country of issue： Japan (JPN)  Language： JAPANESE (JA)
Thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
*gallium oxide

About gallium oxide

, 
*single crystal

About single crystal

, 
substrate (plate)

About substrate (plate)

, 
*electrical characteristic

About electrical characteristic

, 
defect level

About defect level

, 
liquid phase growth

About liquid phase growth

, 
capacitance-voltage characteristic

About capacitance-voltage characteristic


Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
EFG method (liquid phase growth)

About EFG method (liquid phase growth)


JST classification (1)：
JST classification
Category name(code) classified by JST.
Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (3)：
Terms in the title
Keywords automatically extracted from the title.
β-Ga2O3

About β-Ga2O3

, 
単結晶基板

About 単結晶基板

, 
評価

About 評価


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