About Jiao Guangfan
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About Toledano-Luque Maria
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About Nam Kab-Jin
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About Toshiro Nakanishi
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About Lee Seung-Hun
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About Kim Jin-Soak
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About Kauerauf Thomas
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About Chung EunAe
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About Bae Dong-il
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About Bae Geumjong
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About Kim Dong-Won
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About Hwang Kihyun
About Semiconductor R&D Center, Samsung Electronics Hwasung-City, Gyeonggi-Do, Korea
About IEEE Conference Proceedings
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About silicon
About oxide
About valence band
About electric field
About reliability(property)
About acceptor
About robustness
About 高密度
About バイアス温度不安定性
About NBTI
About pMOSFET
About シリコンゲルマニウム
About Measurement,testing and reliability of solid-state devices
About Transistors
About SiGe
About pMOSFET
About 負バイアス温度不安定性
About NBTI
About アクセプタ
About トラップ