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J-GLOBAL ID:201702243323276724   Reference number:17A0659256

Backscattered electron SEM imaging of resin sections from plant specimens: observation of histological to subcellular structure and CLEM

植物試料からの樹脂切片の後方散乱電子SEMイメージング:組織学的に細胞内構造とCLEMの観察【Powered by NICT】
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Volume: 263  Issue:Page: 142-147  Publication year: 2016 
JST Material Number: B0454B  ISSN: 0022-2720  Document type: Article
Article type: 原著論文  Country of issue: United Kingdom (GBR)  Language: ENGLISH (EN)
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Microscopic methods of living organisms 

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