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J-GLOBAL ID:201702243409283214   Reference number:17A1731545

Monitoring of morphological change of deposited metallic thin film through internal friction of noncontacting piezoelectric oscillator

非接触圧電振動子の内部摩擦による蒸着した金属薄膜の形態学的変化のモニタリング【Powered by NICT】
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Volume: 2017  Issue: IUS  Page:Publication year: 2017 
JST Material Number: W2441A  Document type: Proceedings
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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During deposition of metallic ...
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Metallic thin films  ,  Measuring methods and instruments of R,L,C,Q, and dielectric constant 

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