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J-GLOBAL ID：201702253666556530   Reference number：17A1020005

Characterization of grown-in dislocations in high-quality glucose isomerase crystals by synchrotron monochromatic-beam X-ray topography

シンクロトロン単色ビームX線トポグラフィーによる高品質グルコースイソメラーゼ結晶中のgrown-in転位の特性評価【Powered by NICT】

Author (8)： Suzuki Ryo (Graduate School of Nanobioscience, Yokohama City University, 22-2 Seto, Kanazawa-ku, Yokohama 236-0027, Japan) ,  Koizumi Haruhiko (Institute for Materials Research, Tohoku University, 2-1-1, Katahira, Aoba-ku, Sendai 980-8577, Japan) ,  Kojima Kenichi (Department of Education, Yokohama Soei University, 1 Miho-cho, Midori-ku, Yokohama 226-0015, Japan) ,  Fukuyama Seijiro (Advanced Engineering Services Co., Ltd., Tsukuba Mitsui Bldg., 1-6-1 Takezono, Tsukuba, Ibaraki 305-0032, Japan) ,  Arai Yasutomo (Japan Aerospace Exploration Agency (JAXA), 2-1-1 Sengen, Tsukuba, Ibaraki 305-8505, Japan) ,  Tsukamoto Katsuo (Graduate School of Engineering, Osaka University, Suita, Osaka 565-0871, Japan) ,  Suzuki Yoshihisa (Department of Applied Chemistry, Graduate School of Science and Technology, Tokushima University, 2-1 Minamijosanjima, Tokushima 770-8506, Japan) ,  Tachibana Masaru (Graduate School of Nanobioscience, Yokohama City University, 22-2 Seto, Kanazawa-ku, Yokohama 236-0027, Japan)
Material： Journal of Crystal Growth  (J Cryst Growth)
Volume： 468  Page： 299-304  Publication year： 2017 
JST Material Number： B0942A  ISSN： 0022-0248  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Abstract/Point： High quality glucose isomerase...

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Thesaurus term： crystal structure ,  *crystal ,  interface (surface) ,  single crystal ,  *synchrotron ,  seed crystal ,  *X-ray diffraction topography ,  metal crystal ,  Proteins ,  lattice defect ,  *characterization ,  silicon ,  Burgers vector ,  *glucose isomerase ,  *high quality

Author keywords (5)： A1. Characterization ,  A1. Defects ,  A1. X-ray topography ,  A2. Seed crystals ,  B1. Proteins

JST classification (3)： Crystal growth of semiconductors  (BK13040X) ,  Lattice defects in other inorganic compounds  (BK12050B) ,  Crystal growth of other inorganic compounds  (BK13060T)

Terms in the title (7)： シンクロトロン ,  X線トポグラフィー ,  高品質 ,  グルコースイソメラーゼ ,  結晶 ,  転位 ,  特性評価