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J-GLOBAL ID：201702259999286170   Reference number：17A1382869

Local heating induced by single MeV C₆₀ ion impacts

単一MeV C_60イオン衝撃により誘起された局所加熱【Powered by NICT】

Author (8)： Hayashi H. (Department of Micro Engineering, Kyoto University, Kyoto 615-8540, Japan) ,  Matsuzaki S. (Department of Micro Engineering, Kyoto University, Kyoto 615-8540, Japan) ,  Nakajima K. (Department of Micro Engineering, Kyoto University, Kyoto 615-8540, Japan) ,  Narumi K. (Takasaki Advanced Radiation Research Institute, QST, Takasaki, Gumma 370-1292, Japan) ,  Saitoh Y. (Takasaki Advanced Radiation Research Institute, QST, Takasaki, Gumma 370-1292, Japan) ,  Tsujimoto M. (Institute for Integrated Cell-Material Sciences, Kyoto University, Kyoto 606-8501, Japan) ,  Toulemonde M. (CIMAP-GANIL (CEA-CNRS-ENSICAEN-Universite de Caen Basse Normandie), Bd. H. Becquerel, 14070 Caen, France) ,  Kimura K. (Department of Micro Engineering, Kyoto University, Kyoto 615-8540, Japan)
Material： Nuclear Instruments & Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms  (Nuclear Instruments and Methods in Physics Research. Section B. Beam Interactions with Materials and Atoms)
Volume： 406  Issue： PB  Page： 591-595  Publication year： 2017 
JST Material Number： H0899A  ISSN： 0168-583X  Document type： Article
Article type： 原著論文  Country of issue： Netherlands (NLD)  Language： ENGLISH (EN)

Abstract/Point： Gold and platinum nanoparticle...

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Thesaurus term： Gold ,  silicon nitride ,  spatial distribution ,  nano particle ,  *ion collision ,  thermal spike ,  amorphous state ,  film thickness ,  silicon oxide ,  carbon ion ,  platinum nanoparticle ,  *local heating

Author keywords (5)： Thermal spike ,  C₆₀ ,  Temperature measurement ,  Amorphous silicon nitride ,  Amorphous silicon oxide

JST classification (1)： Interactions with ions  (BK16070Z)

Terms in the title (3)： イオン衝撃 ,  誘起 ,  局所加熱