Measurements of defect PL in a-Si:H by means of frequency resolved spectroscopy

OGIHARA C.

Art

J-GLOBAL ID：201702285371136482 Reference number：17A0822215

Measurements of defect PL in a-Si:H by means of frequency resolved spectroscopy

周波数分解スペクトロスコピの方法によるa-Si:Hにおける欠陥PLの測定

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Volume： 28 Issue： 10 Page： 7121-7125 Publication year： May. 2017
JST Material Number： W0003A ISSN： 0957-4522 CODEN： JMTSAS Document type： Article
Article type：原著論文 Country of issue： United States (USA) Language： ENGLISH (EN)

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Measurement,testing and reliability of solid-state devices

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