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J-GLOBAL ID:201702285371136482   Reference number:17A0822215

Measurements of defect PL in a-Si:H by means of frequency resolved spectroscopy

周波数分解スペクトロスコピの方法によるa-Si:Hにおける欠陥PLの測定
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Volume: 28  Issue: 10  Page: 7121-7125  Publication year: May. 2017 
JST Material Number: W0003A  ISSN: 0957-4522  CODEN: JMTSAS  Document type: Article
Article type: 原著論文  Country of issue: United States (USA)  Language: ENGLISH (EN)
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Measurement,testing and reliability of solid-state devices 
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