Rchr
J-GLOBAL ID:201801018052844104   Update date: Jun. 28, 2024

Harada Tetsuo

ハラダ テツヲ | Harada Tetsuo
Affiliation and department:
Research field  (1): Quantum beam science
Research keywords  (2): EUV Lithography ,  Soft-X-ray Optical Engineering
Research theme for competitive and other funds  (7):
  • 2019 - 2022 EUV Wavefront Synthesizer for Real-Time and Extended Depth-of-Focus Imaging
  • 2019 - 2022 Spatial Distribution Analysis of Photo Resist Using Resonant Soft X-ray Reflectmetry and Scattering methods
  • 2015 - 2018 Precise measurement of optical constants of thin films in soft X-ray region
  • 2013 - 2016 Development of 1X nm EUV Resist with high sensitivity and Low LWR
  • 2010 - 2012 Resist pattern replication using EUV interference lithography for 20 nm and below
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Papers (136):
  • Takahiro Ueda, Marcio D. Lima, Tetsuo Harada, Takeo Watanabe, Takeshi Kondo. EUV durability of CNT pellicles for next-generation scanner. Japanese Journal of Applied Physics. 2024. 63. 3
  • Rikuya Imai, Shinji Yamakawa, Tetsuo Harada, Takeo Watanabe. Present Status of EUV Interference Lithography at NewSUBARU. Journal of Photopolymer Science and Technology. 2023. 36. 1. 53-59
  • Shinji Yamakawa, Tetsuo Harada, Koji Nakanishi, Takeo Watanabe. Characterization of Photoacid Generator Bound Resist with X-ray Absorption Spectroscopy at NewSUBARU. Journal of Photopolymer Science and Technology. 2023. 36. 1. 47-52
  • Atsunori Nakamoto, Shinji Yamakawa, Tetsuo Harada, Takeo Watanabe. Spatial Distribution Analysis of Polymers in Resist Thin Film by Reflection-mode Resonant Soft X-ray Scattering. Journal of Photopolymer Science and Technology. 2023. 36. 1. 41-45
  • Shuhei Iguchi, Tetsuo Harada, Shinji Yamakawa, Takeo Watanabe, Takeharu Motokawa. Spatial Distribution Imaging of Resist Thin Film with Micrometer Resolution using Reflection Type Soft X-ray Projection Microscope. Journal of Photopolymer Science and Technology. 2023. 36. 1. 25-30
more...
MISC (190):
  • 原田哲男. Development of At-Wavelength Mask Microscopes for EUV Lithography. レーザー研究. 2024. 52. 1
  • 「 コウシュツリョク タンハチョウ コウゲン カイハツ ト ソノ オウヨウ ギジュツ ノ シンテン 」 トクシュウゴウ. 2024. 52. 1. 31-35
  • 渡邊健夫, 原田哲男, 山川進二. Current Status and Prospect for EUV Lithography. 応用物理学会春季学術講演会講演予稿集(CD-ROM). 2023. 70th
  • 篭島靖, 上杉健太朗, 亀島敬, 高橋幸生, 武市泰男, 竹内晃久, 原田哲男, 松本浩典, 三村秀和, 矢代航. 光学界の将来ビジョン X線・極端紫外光における真の回折限界に向けて. 光学. 2022. 51. 4
  • 中本敦啓, 山川進二, 原田哲男, 渡邊健夫. Resonant Soft X-Ray Scattering in Reflection-mode for Spacial Evaluation in Resist Thin Film. X線分析討論会講演要旨集. 2022. 58th
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Patents (4):
  • 短波長コヒーレント光源及び透過型の減光機構
  • 欠陥特性評価装置
  • 形状測定装置
  • パタン幅測定装置
Education (3):
  • 2003 - 2007 Tohoku University Graduate School of Engineering Department of Applied Physics
  • 2001 - 2003 Tohoku University Graduate School of Engineering Department of Applied Physics
  • 1997 - 2001 Tohoku University Faculty of Engineering
Professional career (1):
  • Doctor of Engineering
Work history (6):
  • 2024/04 - 現在 University of Hyogo Laboratory of Advanced Science and Technology for Industry
  • 2024/04 - 現在 University of Hyogo Laboratory of Advanced Science and Technology for Industry Professor
  • 2019/04 - 2024/03 University of Hyogo Laboratory of Advanced Science and Technology for Industry Associate Professor
  • 2008/10 - 2019/03 University of Hyogo Laboratory of Advanced Science and Technology for Industry Assistant Professor
  • 2008/04 - 2008/09 Tohoku University Institute of Multidisciplinary Research for Advanced Materials
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