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J-GLOBAL ID：201802230186180813   Reference number：18A0995149

Principal component analysis image fusion of TOF-SIMS and microscopic images and low intensity secondary ion enhancement by pixel reduction

TOF-SIMSと顕微鏡画像の主成分分析画像融合とピクセル還元による低強度二次イオン増強【JST・京大機械翻訳】

Author (6)： Takahashi Kazuma (Department of Materials and Life Science, Seikei University, 3-3-1 Kichijoji-kitamachi, Musashino, Tokyo 180-8633, Japan) ,  Yamagishi Takayuki (Department of Materials and Life Science, Seikei University, 3-3-1 Kichijoji-kitamachi, Musashino, Tokyo 180-8633, Japan) ,  Aoyagi Satoka (Department of Materials and Life Science, Seikei University, 3-3-1 Kichijoji-kitamachi, Musashino, Tokyo 180-8633, Japan) ,  Aoki Dan (Department of Biosphere Resources Science, Graduate School of Bioagricultural Sciences, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8601, Japan) ,  Fukushima Kazuhiko (Department of Biosphere Resources Science, Graduate School of Bioagricultural Sciences, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8601, Japan) ,  Kimura Yoshishige (Department of Liberal Arts and Sciences, Kanagawa University of Human Services, 1-10-1 Heisei-cho, Yokosuka, Kanagawa 238-8522, Japan)
Material： Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena  (Journal of Vacuum Science & Technology. B. Nanotechnology & Microelectronics: Materials, Processing, Measurement, & Phenomena)
Volume： 36  Issue： 3  Page： 03F113-03F113-6  Publication year： 2018 
JST Material Number： E0974A  ISSN： 2166-2746  CODEN： JVTBD9  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： Time-of-flight secondary ion m...

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Thesaurus term： *image ,  chemical information ,  robustness ,  *secondary ion ,  *pixel ,  data fusion ,  *Principal Component Analysis ,  space resolving power ,  sparse modeling ,  *TOF-SIMS
Semi thesaurus term： スコア ,  スパース性 ,  *画像融合 ,  *顕微鏡画像 , 【Automatic Indexing@JST】

JST classification (1)： Mass spectrometry  (CC03013N)

Terms in the title (8)： TOF-SIMS ,  顕微鏡画像 ,  主成分分析 ,  画像融合 ,  ピクセル ,  還元 ,  二次イオン ,  増強