Art
J-GLOBAL ID：201802247902277461   Reference number：18A1257809

The impact of production defects on the soft-error tolerance of hardened latches

硬化ラッチのソフトエラー耐性に及ぼす生産欠陥の影響【JST・京大機械翻訳】
Author (3)：
Holst Stefan

About Holst Stefan

(Kyushu Institute of Technology, Iizuka, 820-8502, Japan)

About Kyushu Institute of Technology, Iizuka, 820-8502, Japan

, 
Ma Ruijun

About Ma Ruijun

(Kyushu Institute of Technology, Iizuka, 820-8502, Japan)

About Kyushu Institute of Technology, Iizuka, 820-8502, Japan

, 
Wen Xiaoqing

About Wen Xiaoqing

(Kyushu Institute of Technology, Iizuka, 820-8502, Japan)

About Kyushu Institute of Technology, Iizuka, 820-8502, Japan


Material：
IEEE Conference Proceedings  (IEEE Conf Proc)

About IEEE Conference Proceedings


Volume： 2018  Issue： ETS  Page： 1-6  Publication year： 2018 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)
Abstract/Point：
Abstract/Point
Japanese summary of the article(about several hundred characters).
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Thesaurus term：
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*soft error

About soft error

, 
redundancy (property)

About redundancy (property)

, 
transient fault

About transient fault


Semi thesaurus term：
Thesaurus term/Semi thesaurus term
Keywords indexed to the article.
All keywords is available on JDreamIII(charged).
On J-GLOBAL, this item will be available after more than half a year after the record posted. In addtion, medical articles require to login to MyJ-GLOBAL.
脆弱性

About 脆弱性

, 【Automatic Indexing@JST】
JST classification (2)：
JST classification
Category name(code) classified by JST.
Semiconductor integrated circuit 
(NC03162T)

About Semiconductor integrated circuit

,  Measurement,testing and reliability of solid-state devices 
(NC03040G)

About Measurement,testing and reliability of solid-state devices

Terms in the title (4)：
Terms in the title
Keywords automatically extracted from the title.
硬化

About 硬化

, 
ソフトエラー

About ソフトエラー

, 
耐性

About 耐性

, 
欠陥

About 欠陥


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