Rchr
J-GLOBAL ID：200901080980799621   Update date: Sep. 24, 2024

Wen Xiaoqing

オン ギョウセイ | Wen Xiaoqing
Affiliation and department：
Kyushu Institute of Technology Faculty of Computer Science and Systems Engineering Department of Computer Science and Networks

About Kyushu Institute of Technology Faculty of Computer Science and Systems Engineering Department of Computer Science and Networks


Job title： Professor
Other affiliations (2)：
Homepage URL  (1)： https://www.vlab.cse.kyutech.ac.jp/~wen/index.htm
Research field  (2)： Information networks ,  Computer systems
Research keywords  (10)： 高信頼性設計 ,  故障診断 ,  テスト容易化設計 ,  テスト ,  LSI ,  High-Reliability Design ,  Fault Diagnosis ,  Design for Testability ,  Test ,  LSI
Research theme for competitive and other funds  (21)：
  • 2021 - 2025 Research on Defect-Aware Soft-Error Mitigation for Reliable LSIs
  • 2017 - 2021 Shift-Power-Safe Scan Test Methodology for High-Quality Low-Power LSI Circuits
  • 2015 - 2018 Research on High-Quality Test Method for Avoiding False Testing of Next-Generation Low-Power LSIs
  • 2013 - 2018 Research on Extra-Low-Power Self-Test for LSI Circuits in Implantable Medical Devices
  • 2012 - 2015 Research on Logic Switching Activity Balanced Test for High-Quality Low-Cost LSIs
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Papers (13)：
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MISC (313)：
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Patents (227)：
  • Mask network design for scan-based integrated circuits
  • MULTIPLE-CAPTURE DFT SYSTEM FOR DETECTING OR LOCATING CROSSING CLOCK-DOMAIN FAULTS DURING SCAN-TEST
  • MULTIPLE-CAPTURE DFT SYSTEM FOR DETECTING OR LOCATING CROSSING CLOCK-DOMAIN FAULTS DURING SCAN-TEST
  • Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-test
  • Multiple-capture DFT system for detecting or locating crossing clock-domain faults during scan-test
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Books (20)：
  • 第3章 "半導体製品の分類"、はかる×わかる半導体 半導体テスト技術者検定3級 問題集
    日経BPコンサルティング 2014 ISBN:9784864430715
  • Chapter 9 "Low-Power Testing for 2D/3D Devices and Systems" in Design of 3D Integrated Circuits and Systems
    CRC Press 2014 ISBN:9781466589407
  • Chapter 9 "Low-Power Testing for 2D/3D Devices and Systems" in Design of 3D Integrated Circuits and Systems
    CRC Press 2014 ISBN:9781466589407
  • 第3章 "半導体製品の分類"、はかる×わかる半導体 入門編
    日経BPコンサルティング 2013 ISBN:9784864430395
  • Chapter 20 "Low-Power Testing for Low-Power LSI Circuits", Advanced Circuits for Emerging Technologies
    John Wiley & Sons 2012 ISBN:9780470900055
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Lectures and oral presentations  (44)：
  • 実速度スキャンテストにおける高品質なキャプチャ安全性保障型テスト生成について
    (第66回 FTC 研究会 2012)
  • New Test Partition Approach for Rotating Test with Lower Rate
    (第66回 FTC 研究会 2012)
  • テストベクトル変換手法を用いた低消費電力LOS実速度テスト
    (電子情報通信学会技術研究報告. DC, ディペンダブルコンピューティング 2011)
  • 実速度スキャンテストベクトルに対する遷移タイミング考慮キャプチャ安全性判定
    (電子情報通信学会技術研究報告 2011)
  • 知識ベースシステムに基づいたLSIテスト不良原因解析について
    (電子情報通信学会技術研究報告 2010)
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Works (53)：
  • 高品質な低電力LSI創出に貢献するシフト電力安全型スキャンテスト方式に関する研究
    2017 - 2021
  • hift-Power-Safe Scan Test Methodology for High-Quality Low-Power Circuits
    2017 - 2021
  • 次世代低電力LSI創出のための誤テスト回避型高品質テスト方式に関する研究
    2015 - 2018
  • High-Quality False-Test-Avoidance Test for Next-Generation Low-Power LSI Circuits
    2015 - 2018
  • 体内埋込み型医療機器向けLSI回路のための極低電力自己テスト方式に関する研究
    2013 - 2018
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Education (6)：
  • - 1993 Osaka University
  • - 1993 Osaka University Graduate School, Division of Engineering Applied Physics
  • - 1990 Hiroshima University
  • - 1990 Hiroshima University Graduate School, Division of Engineering Information Engineering
  • - 1986 清華大学 計算機科学技術学科 計算機科学技術
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Professional career (3)：
  • Doctor of Engineering (Osaka University)
  • Master (Hiroshima University)
  • Bachelor of Engineering (Tsinghua University)
Work history (23)：
  • 2013 - 2017 Kyushu Institute of Technology Research Center for Dependable Integrated Systems
  • 2013 - 2017 Director,Research Center for Dependable Integrated Systems,Kyushu Institute of Technology
  • 2017 - Kyushu Institute of Technology Faculty of Computer Science and Systems Engineering, Department of Creative Informatics
  • 2017 - Kyushu Institute of Technology Graduate School of Computer Science and Systems Engineering, Creation Informatics
  • 2016 - Universiti Teknologi Malaysia (UTM)Embedded System Research Laboratory Asscociate Member
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Committee career (408)：
  • 2018 - 2019 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) Program Committee Member (2019)
  • 2018 - 2019 International Conference on VLSI Design (VLSID) Program Committee Member (2019)
  • 2018 - 2019 IEEE European Test Symposium (ETS) Program Committee Member (2019)
  • 2018 - 2019 International Symposium on VLSI Design, Automation, and Test (VLSI-DAT) Program Committee Member (2019)
  • 2018 - 2019 International Conference on VLSI Design (VLSID) Program Committee Member (2019)
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Awards (10)：
  • 2018 - Best Paper Award
  • 2018 - Best Paper Award
  • 2016 - Best Paper Award
  • 2016 - Best Paper Award
  • 2012 - IEEEフェロー
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Association Membership(s) (97)：
IEEE International Test Conference in Asia (ITC-Asia) ,  International Conference on Intelligent Green Building and Smart Grid ,  International Doctoral Symposium on Applied Computation and Security Systems (ACSS) ,  IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) ,  IEEE International Symposium on Nanoelectronic and Information Systems (iNIS) ,  and Test (VLSI-DAT) ,  Automation ,  International Symposium on VLSI Design ,  IEEE Asia Pacific Conference on Circuits and Systms (APCCAS) ,  International Conference on VLSI Design (VLSID) ,  IEEE International Reliability Innovations Conference (IRIC) ,  International Conference on Advanced Technologies for Communications (ATC) ,  IEEE Latin-American Test Symposium (LATS) ,  IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ,  Association of Computing Machinery (ACM) ,  Sensing and Control (ICNSC) ,  IEEE International Conference of Networking ,  Automation and Test in Europe Conference and Exhibition (DATE) ,  Design ,  IEEE International Workshop on Impact of Low-Power design on Test and Reliability (LPonTR) ,  IEEE/VSI VLSI Design And Test Symposium (VDAT) ,  IEEE International Conference on ASIC (ASICON) ,  IEEE Pacific Rim International Symposium on Dependable Computing (PRDC) ,  IEEE International Conference on Computer Design (ICCD) ,  IEEE European Test Symposium (ETS) ,  IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT) ,  IEEE International Workshop on Defect and Adaptove Test Analysis (DATA) ,  IEEE International Conference on Design & Test of Integrated Systems in Nanoscale Technology (DTIS) ,  Test and Applications (DELTA) ,  IEEE International Symposium on Electronic Design ,  Design Automation Conference (DAC) ,  Asian and South Pacific Design Automation Conference (ASP-DAC) ,  IEEE Workshop on RTL and High Level Testing (WRTLT) ,  and Evaluation for Dependability ,  Test ,  International Workshop on Computer-Aided Design ,  IEEE Great Lake Symposium on VLSI ,  IEEE Asian Test Symposium (ATS) ,  IEEE International Test Conference (ITC) ,  Indian Journal of VLSI and Electronic System Design ,  Journal of Computer Science and Technology ,  Journal of Electronic Testing: Theory and Applications ,  IEEE Transactions on VLSI Systems ,  IEEE Transactions on Computer-Aided Design ,  日本マイクロ・ナノバブル学会 ,  日本信頼性学会 ,  情報処理学会 ,  電子情報通信学会 ,  Institute of Electrical and Electronics Engineers (IEEE) ,  IEEE International Test Conference in Asia (ITC-Asia) ,  International Conference on Intelligent Green Building and Smart Grid ,  International Doctoral Symposium on Applied Computation and Security Systems (ACSS) ,  IFIP/IEEE International Conference on Very Large Scale Integration (VLSI-SoC) ,  IEEE International Symposium on Nanoelectronic and Information Systems (iNIS) ,  and Test (VLSI-DAT) ,  Automation ,  International Symposium on VLSI Design ,  IEEE Asia Pacific Conference on Circuits and Systms (APCCAS) ,  International Conference on VLSI Design (VLSID) ,  IEEE International Reliability Innovations Conference (IRIC) ,  International Conference on Advanced Technologies for Communications (ATC) ,  IEEE Latin-American Test Symposium (LATS) ,  IEEE Computer Society Annual Symposium on VLSI (ISVLSI) ,  Association of Computing Machinery (ACM) ,  Sensing and Control (ICNSC) ,  IEEE International Conference of Networking ,  Automation and Test in Europe Conference and Exhibition (DATE) ,  Design ,  IEEE International Workshop on Impact of Low-Power design on Test and Reliability (LPonTR) ,  IEEE/VSI VLSI Design And Test Symposium (VDAT) ,  IEEE International Conference on ASIC (ASICON) ,  IEEE Pacific Rim International Symposium on Dependable Computing (PRDC) ,  IEEE International Conference on Computer Design (ICCD) ,  IEEE European Test Symposium (ETS) ,  Test and Applications (DFT) ,  IEEE International Workshop on Defect and Adaptove Test Analysis (DATA) ,  IEEE International Conference on Design & Test of Integrated Systems in Nanoscale Technology (DTIS) ,  Test and Applications (DELTA) ,  IEEE International Symposium on Electronic Design ,  Design Automation Conference (DAC) ,  Asian and South Pacific Design Automation Conference (ASP-DAC) ,  IEEE Workshop on RTL and High Level Testing (WRTLT) ,  and Evaluation for Dependability ,  Test ,  International Workshop on Computer-Aided Design ,  IEEE Great Lake Symposium on VLSI ,  IEEE Asian Test Symposium (ATS) ,  IEEE International Test Conference (ITC) ,  Journal of Electronic Testing: Theory and Applications ,  IEEE Transactions on VLSI Systems ,  IEEE Transactions on Computer-Aided Design ,  Japan Micro-Nano Bubble Society Corporation ,  Reliability Engineering Association of Japan ,  Information Processing Society of Japan (IPSJ) ,  Information and Communication Engineers (IEICE) ,  Institute of Electronic ,  Institute of Electrical and Electronics Engineers (IEEE)
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