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J-GLOBAL ID:201802276720545289   Reference number:18A0118522

Seebeck effect measurement of rare metal free oxide semiconductor

レアメタルフリー酸化物半導体のゼーベック効果測定
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Volume: 117  Issue: 372(EID2017 11-29)  Page: 29-34  Publication year: Dec. 15, 2017 
JST Material Number: S0532B  ISSN: 0913-5685  Document type: Proceedings
Article type: 原著論文  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Thermoelectric devices 
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