Art
J-GLOBAL ID:201802284437854268   Reference number:18A2207303

Investigation for Energy Levels of an Organic Thin-film Semiconductor by Photoemission Yield Spectroscopy in Air

大気中光電子収量分光分析による有機薄膜半導体のエネルギー準位の測定
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Material:
Volume: 67  Issue: 11  Page: 647-651(J-STAGE)  Publication year: 2018 
JST Material Number: F0008A  ISSN: 0525-1931  CODEN: BNSKAK  Document type: Article
Article type: 短報  Country of issue: Japan (JPN)  Language: JAPANESE (JA)
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Thin films of organic compounds  ,  Electron spectroscopic determination of structures  ,  Complexes of nontransition metal elements  ,  Electron spectroscopy of organic and complex molecules 
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