Art

J-GLOBAL ID：201802289944956078   Reference number：18A1899163

Verification of the Injection Enhancement Effect in IGBTs by Measuring the Electron and Hole Currents Separately

電子および正孔電流を別々に測定することによるIGBTにおける注入増強効果の検証【JST・京大機械翻訳】

Author (18)： Hoshii T. (Tokyo Institute of Technology, Yokohama, Japan) ,  Furukawa K. (Tokyo Institute of Technology, Yokohama, Japan) ,  Kakushima K. (Tokyo Institute of Technology, Yokohama, Japan) ,  Watanabe M. (Tokyo Institute of Technology, Yokohama, Japan) ,  Shigvo N. (Tokyo Institute of Technology, Yokohama, Japan) ,  Saraya T. (Tokyo Institute of Technology, Yokohama, Japan) ,  Takakura T. (The Universitv of Tokvo, Tokvo, Janan) ,  Ltou K. (The Universitv of Tokvo, Tokvo, Janan) ,  Fukui M. (The Universitv of Tokvo, Tokvo, Janan) ,  Suzuki S. (The Universitv of Tokvo, Tokvo, Janan) ,  Takeuchi K. (The Universitv of Tokvo, Tokvo, Janan) ,  Muneta I. (Tokyo Institute of Technology, Yokohama, Japan) ,  Wakabayashi H. (Tokyo Institute of Technology, Yokohama, Japan) ,  Nishizawa S. (Kyushu University, Fukuoka, Japan) ,  Tsutsui K. (The Universitv of Tokvo, Tokvo, Janan) ,  Hiramoto T. (The Universitv of Tokvo, Tokvo, Janan) ,  Ohashi H. (Tokyo Institute of Technology, Yokohama, Japan) ,  Lwai H. (Tokyo Institute of Technology, Yokohama, Japan)
Material： IEEE Conference Proceedings  (IEEE Conf Proc)
Volume： 2018  Issue： ESSDERC  Page： 26-29  Publication year： 2018 
JST Material Number： W2441A  Document type： Proceedings
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： The injection enhancement effe...

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Thesaurus term： ladder ,  *IGBT ,  *electric current ,  simulation ,  *positive hole ,  electron injection

JST classification (1)： Graphic and image processing in general  (JE04010I)

Terms in the title (6)： 電子 ,  正孔 ,  IGBT ,  注入 ,  増強 ,  検証