Art
J-GLOBAL ID:201802290039235629   Reference number:18A0025951

Circuit and synaptic mechanisms of repeated stress: Perspectives from differing contexts, duration, and development

反復ストレスの回路およびシナプス機構:異なる文脈,継続時間,開発からの展望【Powered by NICT】
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Volume:Page: 137-151  Publication year: 2017 
JST Material Number: W3048A  ISSN: 2352-2895  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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Central nervous system 
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