Art
J-GLOBAL ID:201802291329401943   Reference number:18A1248750

Analysis of current drift on p-channel pH-Sensitive SiNW ISFET by capacitance measurement

静電容量測定によるpチャネルpH感受性SINW ISFETにおける電流ドリフトの解析【JST・京大機械翻訳】
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Volume: 18  Issue:Page: S68-S74  Publication year: 2018 
JST Material Number: W1579A  ISSN: 1567-1739  Document type: Article
Article type: 原著論文  Country of issue: Netherlands (NLD)  Language: ENGLISH (EN)
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The mechanism of drift effect ...
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Transistors 

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