Art

J-GLOBAL ID：201902200560032488   Reference number：19S1706504

The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization

Author (6)： Nikawa, Kiyoshi (Graduate School of Information Science and Technology, Osaka University) ,  Miura, Katsuyoshi (Graduate School of Information Science and Technology, Osaka University) ,  Midoh, Yoshihiro (Graduate School of Information Science and Technology, Osaka University) ,  Nakamae, Koji (Graduate School of Information Science and Technology, Osaka University) ,  Yamashita, Masatsugu (Terahertz Sensing and Imaging Laboratory, RIKEN Sendai) ,  Matsumoto, Toru (Hamamatsu Photonics)
Material： Microelectronics Reliability
Volume： 51  Issue： 9-11  Page： 1624-1631  Publication year： 2011 
JST Material Number： SCOPUS  ISSN： 0026-2714  CODEN： MCRLA 
Country of issue： United Kingdom (GBR)  Language： English (EN)

Terms in the title (2)： LASER ,  SQUID