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J-GLOBAL ID：201902201257909772   Reference number：19S1701107

Negative differential resistance characteristics of nanoscale in-plane gate devices

Author (9)： Komatsuzaki, Yuji (School of Science and Engineering, Waseda University) ,  Komatsuzaki, Yuji (Kagami Memorial Laboratory for Materials Science and Technology, Waseda University) ,  Higashi, Kazuhiro (School of Science and Engineering, Waseda University) ,  Higashi, Kazuhiro (Kagami Memorial Laboratory for Materials Science and Technology, Waseda University) ,  Kyougoku, Tomoteru (School of Science and Engineering, Waseda University) ,  Kyougoku, Tomoteru (Kagami Memorial Laboratory for Materials Science and Technology, Waseda University) ,  Horikoshi, Yoshiji (School of Science and Engineering, Waseda University) ,  Horikoshi, Yoshiji (Kagami Memorial Laboratory for Materials Science and Technology, Waseda University) ,  Onomitsu, Koji (NTT Basic Reseach Laboratories, NTT Corporation)
Material： Physica Status Solidi (C) Current Topics in Solid State Physics
Volume： 8  Issue： 2  Page： 408-410  Publication year： 2011 
JST Material Number： SCOPUS  ISSN： 1862-6351 
Country of issue： Germany (DEU)  Language： English (EN)