Art

J-GLOBAL ID：201902220985180408   Reference number：19A2560191

A 22-bit Read-Out IC With 7-ppm INL and Sub-100- $¥mu$ Hz 1/ $f$ Corner for DC Measurement Systems

DC測定システムのための7ppm INLとサブ100μHz 1/fコーナーを持つ22ビット読出しIC【JST・京大機械翻訳】

Author (4)： Jun Jaehoon (Department of Electrical Engineering and Computer Engineering, Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea) ,  Park Soungchul (Department of Electrical Engineering and Computer Engineering, Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea) ,  Kang Junho (Department of Electrical Engineering and Computer Engineering, Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea) ,  Kim Suhwan (Department of Electrical Engineering and Computer Engineering, Inter-University Semiconductor Research Center, Seoul National University, Seoul, South Korea)
Material： IEEE Journal of Solid-State Circuits  (IEEE J Solid-State Circuits)
Volume： 54  Issue： 11  Page： 3086-3096  Publication year： 2019 
JST Material Number： B0761A  ISSN： 0018-9200  CODEN： IJSCBC  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： A 22-bit read-out integrated c...

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Thesaurus term： digital filter ,  analog to digital converter ,  1/f noise ,  offset ,  *measurement system ,  amplifier ,  integrated circuit ,  transistor ,  filter ,  gain ,  clamp(fastener) ,  resolving power
Semi thesaurus term： 有限インパルス応答 ,  オンチップ ,  *読出し , 【Automatic Indexing@JST】

JST classification (2)： Semiconductor integrated circuit  (NC03162T) ,  AD/DA conversion circuits  (NC05080M)

Terms in the title (8)： DC ,  測定システム ,  INL ,  サブ ,  コーナー ,  ビット ,  読出し ,  IC