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J-GLOBAL ID：201902238430834439   Reference number：19A2399388

Obtaining the scattering rate of different T_c0 FeSe thin films via spectroscopic ellipsometry

分光偏光解析法による異なるT_c0FeSe薄膜の散乱速度の取得【JST・京大機械翻訳】

Author (10)： Shi Yujun (School of Information Science and Engineering, and Shandong Provincial Key Laboratory of Laser Technology and Application, Shandong University, Qingdao 266237, Shandong, China) ,  Lian Jie (School of Information Science and Engineering, and Shandong Provincial Key Laboratory of Laser Technology and Application, Shandong University, Qingdao 266237, Shandong, China) ,  Feng Zhongpei (National Lab for Superconductivity, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China) ,  Zhao Minglin (Department of Physics, Jiangsu University of Science and Technology, Zhenjiang 212003, Jiangsu, China) ,  Jin Kui (National Lab for Superconductivity, Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China) ,  Song Haonan (School of Information Science and Engineering, and Shandong Provincial Key Laboratory of Laser Technology and Application, Shandong University, Qingdao 266237, Shandong, China) ,  Wei Mingyang (School of Information Science and Engineering, and Shandong Provincial Key Laboratory of Laser Technology and Application, Shandong University, Qingdao 266237, Shandong, China) ,  Dai Kai (School of Information Science and Engineering, and Shandong Provincial Key Laboratory of Laser Technology and Application, Shandong University, Qingdao 266237, Shandong, China) ,  Jiang Qingfen (School of Information Science and Engineering, and Shandong Provincial Key Laboratory of Laser Technology and Application, Shandong University, Qingdao 266237, Shandong, China) ,  Fang Jiaxiong (Advanced Research Center for Optics, Shandong University, Jinan 250100, Shandong, China)
Material： Journal of Vacuum Science & Technology. B. Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena  (Journal of Vacuum Science & Technology. B. Nanotechnology & Microelectronics: Materials, Processing, Measurement, & Phenomena)
Volume： 37  Issue： 5  Page： 052907-052907-6  Publication year： 2019 
JST Material Number： E0974A  ISSN： 2166-2746  CODEN： JVTBD9  Document type： Article
Article type： 原著論文  Country of issue： United States (USA)  Language： ENGLISH (EN)

Abstract/Point： Due to the simplest crystallin...

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Thesaurus term： crystal structure ,  characterization ,  lattice constant ,  superconductor ,  thin film growth ,  atomic force microscope ,  substrate(plate) ,  optical measurement ,  *selenium ,  frequency ,  pulsed laser deposition ,  X-ray diffraction ,  *thin film ,  single crystal ,  plasma ,  complex index of refraction

JST classification (2)： Thin films of other inorganic compounds  (BK14060A) ,  Semiconductor thin films  (BK14040E)

Terms in the title (3)： 分光偏光解析法 ,  薄膜 ,  散乱速度